Brand New XCS Series!

Small Field of View, Big Impact: New XCS Sensor from AT Transforms the Electronics Industry

In the semiconductor industry, it is the smallest details that make the difference between success and failure. With its new 3D sensor from the recently developed XCS series, AT – Automation Technology is launching a product onto the market that is a real game changer, especially for high-performance applications in the electronics industry.

Highlights:

• Unique 3D scan results without occlusion due to dual-head option and extremely high profile speed of 3072 or 4096 points/profile
• High precision and detection of the smallest surface details thanks to high-quality laser line projection
• Unrivaled resolution for electronics inspection (e.g. BGA inspection) with a field of view of up to 2.08 in (53 mm)
• Highest inspection speed possible with the 3070 WARP sensor variant